Microstructure Evolution of Ag/TiO2 Thin Film

Ag/TiO2 thin films were prepared using the sol-gel spin coating method. The microstructural growth behaviors of elucidated real-time synchrotron radiation imaging, its structure was determined grazing incidence X-ray diffraction (GIXRD), morphology imaged field emission scanning electron microscopy (FESEM), and surface topography examined atomic force microscope (AFM) in contact mode. cubical shape detected identified as Ag, while anatase, TiO2 film resembled a porous ring-like structure. It found that each ring coalesced formed channels occurred at low annealing temperature 280 °C. energy dispersive (EDX) result revealed small amount Ag presence films. From in-situ it observed time increased, also increased terms area number junctions. rate 600 s 47.26 µm2/s, after 1200 decreased to 11.50 µm2/s 11.55 1800 s. Prolonged will further decrease 5.94 4.12 4.86 2400 s, 3000 3600 respectively.